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課程名稱 |
高分子表面分析專論
Special Topic in Polymer and Surface Analysis |
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開課學期 |
105-1 |
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授課對象 |
工學院 高分子科學與工程學研究所 |
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授課教師 |
賴育英 |
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課號 |
PSE7030 |
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課程識別碼 |
549 M2060 |
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班次 |
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學分 |
3 |
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全/半年 |
半年 |
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必/選修 |
選修 |
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上課時間 |
星期一2,3,4(9:10~12:10) |
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上課地點 |
共201 |
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備註 |
總人數上限：35人 |
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Ceiba 課程網頁 |
http://ceiba.ntu.edu.tw/1051PSE7030_ |
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課程簡介影片 |
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核心能力關聯 |
核心能力與課程規劃關聯圖 |
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課程大綱
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課程概述 |
1. Introduction to polymer and thin-film preparation
2. Time-of-flight secondary ion mass spectrometry
3. X-ray photoelectron spectroscopy
4. Grazing incidence X-ray diffraction
5. Resonant Soft X-ray Scattering
6. Atomic force microscopy
7. Scanning electron microscopy
8. Transmission electron microscopy
9. Scanning tunneling microscopy
10. Infrared spectroscopy
11. Wettability measurements
12. Ellipsometry |
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課程目標 |
1. Understand the working principles of numerous polymer-surface-characterization techniques.
2. Capable of designing reasonable characterization procedures towards polymer surfaces with various functions.
3. Learn how to present polymer-surface-characterization measurement results in a concise and clear manner.
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課程要求 |
Exercise, Presentation, Midterm exam, and Final exam |
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預期每週課後學習時數 |
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Office Hours |
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指定閱讀 |
Polymer Surface Characterization
Ed. by Sabbatini, Luigia
With contrib. by Bittrich, Eva / Cometa, Stefania / De Giglio, Elvira / Di Mundo, Rosa / Ditaranto, Nicoletta / Eichhorn, Klaus Jochen / Keller, Beat / Lednický, Frantisek / Mangolini, Filippo / Palumbo, Fabio / Rossi, Antonella / Slouf, Miroslav / Vacková, Tatana / Wandrol, Petr / Yablon, Dalia
Berlin ; Boston : De Gruyter, 2014 2014
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參考書目 |
Polymer, chemistry, or materials-related journals |
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評量方式
(僅供參考) |
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No. |
項目 |
百分比 |
說明 |
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1. |
Exercise 1 |
10% |
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2. |
Midterm exam |
30% |
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3. |
Presentation |
15% |
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4. |
Exercise 2 |
10% |
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5. |
Final exam |
35% |
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週次 |
日期 |
單元主題 |
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第1週 |
9/12 |
General introduction |
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第2週 |
9/19 |
Introduction to polymer |
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第3週 |
9/26 |
Thin film preparation |
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第4週 |
10/03 |
Secondary ion mass spectrometry |
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第5週 |
10/10 |
Holiday |
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第6週 |
10/17 |
Secondary ion mass spectrometry
X-ray photoelectron spectroscopy |
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第7週 |
10/24 |
X-ray photoelectron spectroscopy
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第8週 |
10/31 |
Exercise 1 |
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第9週 |
11/07 |
Midterm exam |
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第10週 |
11/14 |
Grazing incidence X-ray diffraction
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第11週 |
11/21 |
Atomic force microscopy
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第12週 |
11/28 |
Scanning electron microscopy
Transmission electron microscopy
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第13週 |
12/05 |
Scanning tunneling microscopy
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第14週 |
12/12 |
Presentation |
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第15週 |
12/19 |
Infrared spectroscopy
Wettability measurements |
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第16週 |
12/26 |
Exercise 2 |
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第17週 |
1/02 |
Holiday |
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第18週 |
1/09 |
Final exam |
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